ITEE Ph.D confirmation seminar: Yang David Hong, 11.00AM, Thu 07 Aug 2003
Modelling and Inverse Modelling Of Scanning Capacitance Microscopy For Dopant Profile Extraction
Speaker: Yang David Hong, ITEE
When: 11.00AM, Thursday 07 Aug 2003
Venue: 78-420
Host: Associate Professor YT Yeow
Abstract:
Scanning capacitance microscopy (SCM) is becoming a powerful tool for dopant profile extraction for deep submicron silicon integrated circuits. It is based on high-frequency response of the MOS capacitor between the SCM probe and the underlying semiconductor. In early applications of SCM, a change in capacitance at any point on the semiconductor surface in response to a change in bias is measured and converted to dopant concentration at that point by using calibration curves derived from SCM measurement on known uniformly doped substrates. The approach suffers from the fact that in the presence of a lateral source of minority carriers (such as in the space charge region of a pn-junction) where the change in capacitance deviates significantly from the prediction of the calibration curves. Better understanding of carrier response to SCM signal and new quantitative approaches in junction dopant profiling are needed to fully exploit the nanometer-scale spatial resolution of SCM and to extend it beyond the status of a junction visualization tool. This seminar will cover an introduction to SCM measurement and numerical modelling of SCM measurement, simulation study of measurement/material variables affecting SCM data, comparison of experimental and simulation results of p-n junctions and some consideration of the approaches to be adopted for inverse modelling for accurate extraction of junction dopant profile.
Biography:
Yang David Hong received the BE(1st Class Hons) degree in Electrical Engineering from the University of Queensland, Australia in 2000. From 2001 to 2002 he worked in Motorola, Singapore as a software engineer for embedded systems in mobile communication. Since 2002 he has been a Ph.D student with the School of Information Technology and Electrical Engineering at the University of Queensland.
Type:
Ph.D confirmation
Contact:
Associate Professor YT Yeow, seminar host (yty@itee.uq.edu.au)
or Guido Governatori (ITEE seminar co-ordinator)
(guido@itee.uq.edu.au)
ITEE seminar web page: http://www.itee.uq.edu.au/~seminar
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